|Project Summary||Project Information|
Current directions in semiconductor technology are leading towards Systems on Panel (SoP)-Integrated Circuits implemented on the LCD displays which are used as the central user interface feature. These devices will allow ultra-compact implementation of many different devices. A new process used to construct transistors for SoP systems is Silicon on Glass, (SiOG) developed by Corning Glass. Under the sponsorship of Corning Glass and Carestream Health, RIT's Analog Devices Integrated Microsystems Laboratory (ADIML) is leading the charge to provide the tools and models needed to design systems with this technology.
The Automated TFT Noise Characterization Project
attempts to further this goal by producing a system
to automate measurements of the 1/f and thermal
noise characteristics of SiOG devices, using the
facilities and equipment currently used by the
ADIML. The system will be used to quickly and
efficiently extract modeling parameters for
fabrication process improvement.
Stephen Marshall (EE, Team Leader)
Kendell Clark (EE)
Carmen Parisi (EE)
James Spoth (CE)
Ryan Vaughan (ME)