Current directions in semiconductor technology are leading towards Systems on Panel (SoP)-Integrated Circuits implemented on the LCD displays which are used as the central user interface feature. These devices will allow ultra-compact implementation of many different devices. A new process used to construct transistors for SoP systems is Silicon on Glass, (SiOG) developed by Corning Glass. Under the sponsorship of Corning Glass and Carestream Health, RIT's Analog Devices Integrated Microsystems Laboratory (ADIML) is leading the charge to provide the tools and models needed to design systems with this technology.

The Automated TFT Noise Characterization Project attempts to further this goal by producing a system to automate measurements of the 1/f and thermal noise characteristics of SiOG devices, using the facilities and equipment currently used by the ADIML. The system will be used to quickly and efficiently extract modeling parameters for fabrication process improvement.

Team Members:

Stephen Marshall (EE, Team Leader)

Kendell Clark (EE)

Carmen Parisi (EE)

James Spoth (CE)

Ryan Vaughan (ME)

Project Name

Automated TFT Noise Characterization Platform

Project Number

P10345

Project Family

Open Architecture Control Systems

Track

Autonomous Systems and Controls

Start Term

2009-2

End Term

2009-3

Faculty Guide

George Slack (EE)

Faculty Consultant

Dr. Robert Bowman (EE)

Primary Customer

Dr. Robert Bowman

Sponsor

Dr. Robert Bowman