P10345: Automated TFT Noise Characterization Platform


Project Summary Project Information

Current directions in semiconductor technology are leading towards Systems on Panel (SoP)-Integrated Circuits implemented on the LCD displays which are used as the central user interface feature. These devices will allow ultra-compact implementation of many different devices. A new process used to construct transistors for SoP systems is Silicon on Glass, (SiOG) developed by Corning Glass. Under the sponsorship of Corning Glass and Carestream Health, RIT's Analog Devices Integrated Microsystems Laboratory (ADIML) is leading the charge to provide the tools and models needed to design systems with this technology.

The Automated TFT Noise Characterization Project attempts to further this goal by producing a system to automate measurements of the 1/f and thermal noise characteristics of SiOG devices, using the facilities and equipment currently used by the ADIML. The system will be used to quickly and efficiently extract modeling parameters for fabrication process improvement.

Team Members:

Stephen Marshall (EE, Team Leader)

Kendell Clark (EE)

Carmen Parisi (EE)

James Spoth (CE)

Ryan Vaughan (ME)

Project Name
Automated TFT Noise Characterization Platform
Project Number
Project Family
Open Architecture Control Systems
Autonomous Systems and Controls
Start Term
End Term
Faculty Guide
George Slack (EE)
Faculty Consultant
Dr. Robert Bowman (EE)
Primary Customer
Dr. Robert Bowman
Dr. Robert Bowman

Team Design Repository Information


Released Documents

Project Proposal and Initial Concept Development

Customer Needs

Engineering Specifications

System Design Review Presentation

Detailed Design Review Documents

Technical Conference Publication

Poster Publication

Managerial Design Review Presentation