|Project Summary||Project Information|
Harris Corporation is interested in pursuing new technology to measure coefficient of thermal expansion (CTE) on material samples here on the ground. Current methods of CTE measurement involve one of three main methods to accurately measure sample deformation under an applied range of temperature. These methods are: linear variable differential transformer (LVDT) technology, capacitive sensing, or laser interferometric sensing. However, the theoretical accuracy of these technologies is limited by errors and uncertainties inherent in the test setup. Mechanical error, introduced by the test fixturing, may deform the sample unduly or not allow it ample room to freely expand. Electrical error is introduced as uncertainty in the sensors themselves and noise in the data collection process. Environmental error is the final concern, referring to external factors interfering with the testing, such as vibrations, air currents, or unwanted temperature changes. Our team is working on a new type of fixturing that isolates the sample by magnetic levitation. The intention of this setup is to minimize error due to mechanical and environmental interference, while controlling electrical error as best we can.
For a full project summary, please visit our Problem Definition page.
Left to right: Nathan Brown (EE), Nicholas Ferry (EE), Robert Turbett (ME), Brett Arnold (ME), Robert Morandini (ME), James Fisher (ME)
|Brett Arnold||Data Engineeremail@example.com|
|Nicholas Ferry||Systems Engineer||NJF5368@rit.edu|
|Robert Morandini||Data Engineerfirstname.lastname@example.org|
|Rob Turbett||Design Engineeremail@example.com|
|James Fisher||Lead Engineerfirstname.lastname@example.org|
|Nate Brown||Manufacturing Engineeremail@example.com|
Table of Contents
|MSD I & II||MSD I||MSD II|
AcknowledgementsThanks to the following individuals for their contributions to the project:
- RIT/MSD personnel: Ed Hanzlik, Beth DeBartolo, Jan Maneti, Rob Kraynik, Dave Durfee, & Robert Stevens
- Harris Corporation employees: James Throckmorton, Pat Ellsworth, Dale Landl, Mike Moscato, Evan Bean, Neil Farukhi & Phil Vallone