Harris Corporation is interested in pursuing new technology to measure coefficient of thermal expansion (CTE) on material samples here on the ground. Current methods of CTE measurement involve one of three main methods to accurately measure sample deformation under an applied range of temperature. These methods are: linear variable differential transformer (LVDT) technology, capacitive sensing, or laser interferometric sensing. However, the theoretical accuracy of these technologies is limited by errors and uncertainties inherent in the test setup. Mechanical error, introduced by the test fixturing, may deform the sample unduly or not allow it ample room to freely expand. Electrical error is introduced as uncertainty in the sensors themselves and noise in the data collection process. Environmental error is the final concern, referring to external factors interfering with the testing, such as vibrations, air currents, or unwanted temperature changes. Our team is working on a new type of fixturing that isolates the sample by magnetic levitation. The intention of this setup is to minimize error due to mechanical and environmental interference, while controlling electrical error as best we can.

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Project Name

Harris Thermal Expansion Test Apparatus

Project Number

P17341

Project Family

none

Start Term

2165

End Term

2171

Faculty Guide

Ed Hanzlik, echeee@rit.edu

Primary Customer

Harris Corporation

Primary Contact: James Throckmorton, james.throckmorton@harris.com

Sponsor (financial support)

Harris Corporation

Planning & Execution

Project Photos and Videos

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Problem Definition

Systems Design

Preliminary Detailed Design

Detailed Design

Gate Reviews

Build & Test Prep

Subsystem Build & Test

Integrated System Build & Test

Customer Handoff & Final Project Documentation